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簡要描述:QRM QRM-MicroBar分辨率測試卡內(nèi)含兩個3mm×3mm硅質(zhì)芯片,分別水平和垂直安裝,芯片上刻有條狀(溝槽)和點狀圖樣,度規(guī)格為:1μm,2μm,3μm,4μm,5μm,6μm,7μm,8μm,9μm,10μm.
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型號:QRM-MicroBar 類別: 質(zhì)控模體 品牌:德國QRM pdf資料: QRM QRM-MicroBar測試卡,QRM-MicroBar測試模體,Micro-CT高分辨率測試卡.pdf
QRM QRM-MicroBar測試卡,QRM-MicroBar測試模體,Micro-CT高分辨率測試卡詳細(xì)介紹:
QRM QRM-MicroBar測試卡,QRM-MicroBar測試模體,Micro-CT高分辨率測試卡 技術(shù)參數(shù):
內(nèi)含兩個3mm×3mm硅質(zhì)芯片,分別水平和垂直安裝,芯片上刻有條狀(溝槽)和點狀圖樣,度規(guī)格為:1μm,2μm,3μm,4μm,5μm,6μm,7μm,8μm,9μm,10μm.
作為我們流行的MicroCT-BarPattern-Phantom的進(jìn)一步發(fā)展,我們現(xiàn)在推出BarPattern-NANO!
QRM QRM-MicroBar測試卡,QRM-MicroBar測試模體,Micro-CT高分辨率測試卡易于使用的幻像提供了兩個硅芯片,它們垂直對齊并放置在堅固的塑料支架上。
兩種3 x 3mm2的芯片都具有數(shù)個線和點圖案,分別代表線和點的寬度為1至10 µm。
此外,在芯片上還放置了鋸齒狀邊緣(L)和西門子星(放射狀星)。
芯片上的不同結(jié)構(gòu)以這種方式布置在芯片上,從而可以通過一次測量在圖像/芯片的中心以及外圍區(qū)域中確定空間分辨率。
芯片上的線型和點型:3 x 3mm2
結(jié)構(gòu)的深度在5和15 µm之間變化。
QRM QRM-MicroBar測試卡,QRM-MicroBar測試模體,Micro-CT高分辨率測試卡技術(shù)指標(biāo)
基礎(chǔ)材料: 固體塑料(切屑放在空氣中的支撐件上-壁厚> 0.3 mm)
直徑幻影: 5.2毫米
高度: 19毫米
硅芯片的措施: 3 x 3 x 0.66毫米
芯片上的結(jié)構(gòu)(分辨率): 分別為1至10 µm。500至50 LP / mm
芯片材質(zhì): 硅
圖案對比 硅/空氣
As a further development of our popular MicroCT-BarPattern-Phantom we now present the BarPattern-NANO!
The easy and convenient to use phantom provides two silicon chips, perpendicularly aligned and placed on a solid plastic support.
Both 3 x 3 mm2 chips exhibit several line and point pattern representing lines and points of 1 to 10 µm width.
In addition a slented edge (L) and a Siemens-star (actinomorphic star) are also placed on the chip.
The different structures on the chip are arranged in such a way over the chip, that spatial resolution can be determined in the center as well as in the peripheral regions of the image/chip with a single measurement.
Line- and Pointpattern on the chip: 3 x 3 mm2
The depth of the structures varies within 5 and 15 µm.
Specifications
Base material: solid plastic (chips placed on support in air -> 0.3 mm wall thickness)
Diameter Phantom: 5.2 mm
Height: 19 mm
measures of silicon chip: 3 x 3 x 0.66 mm
structures on the chip (resolution): 1 to 10 µm, resp. 500 to 50 LP/mm
Material of chip: silicon
Contrast of pattern silicon / air
SAG: QRM-MicroBar,QRM-MicroBar測試卡,Micro-CT高分辨率測試卡,QRM-MicroBar測試模體,QRM分辨率測試卡,分辨率測試卡
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